Showing results: 16 - 30 of 308 items found.
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MiNi-HAC -
APREL, Inc.
Hearing Aid Compatibility (HAC) evaluation of wireless handsets ensures accessibility of these technologies to the hearing impaired. The MiNi-HAC system can be used for the design and development of wireless handsets as well as for evaluation of hearing aids used by the hearing impaired to gain access to mobile wireless technologies. RF Emissions Test - near field measurements of the electric and magnetic fields emitted by a wireless device.
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ViTec Co. Ltd
The VR-226N helicopter reduction gearbox test bench measuring system is designed to automate the VR-226N gearbox test process in order to ensure high quality product testing, increase the reliability of measurement information, increase the profitability of the test bench and reduce malfunctions associated with the human factor.
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A.T.E. Solutions Ltd.
We are pleased to announce that we have received an order for the supply of a fully automated in-line test system for testing LED light engines from ASD Lighting, based in Rotherham. The solution provided, consists of an in-line handler fitted with a vision system. The camera software is capable of learning the position of all LED’s on a new pcb, thereby reducing the time to introduce a new product. In addition to identifying the location of any missing or faulty LED’s the tester measures the colour temperature of every pcb. An image is taken of faulty units with the location of any missing LED’s identified
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Chroma Systems Solutions, Inc.
Chroma is the global leader in Electronic Load manufacturing. Chroma’s AC Electronic Loads are designed for testing uninterruptible power supplies(UPS), Off-Grid Inverters, AC sources, and other power devices such as switches, circuit breakers, fuses and connectors. Chroma’s DC Electronic Loads are used for power testing in all markets including automatic test systems, LED, power supply testing, battery testing, and fuel cell testing. Chroma loads can do it all including full current down to 0.4VDC, CZ mode, user defined waveforms, timing measurements, and 3 current ranges per load. Chroma’s electronic loads come standard with either USB or RS232 ports for control and can be configured for GPIB (IEEE-488) control as well.
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LEON InLine -
Konrad Technologies GmbH
High production volume often requires inline solutions with fully automated product Handling – the LEONlnline is a complete Inline Board Test Solutions for printed circuit boards. It integrates a flexible and scalable test system that features an excellent signal integrity and a high-quality fixture interface. This is achieved by combining a cableless connection from ABex modules to Virginia panel interface connectors.
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PXP-500A -
Teledyne LeCroy
The Teledyne LeCroy PXP-500A Test Platform provides a convenient means for testing PCIe 5.0 cards with a self-contained portable and powered passive backplane. The PXP-500A provides power required for both cards under test.
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Teledyne LeCroy
Teledyne LeCroy’s PCI Express 5.0 Test Platform is part of a suite of tools that facilitates complete protocol testing of PCI Express devices up to and including version 5.0. The latest feature of the Teledyne LeCroy Test Platform is the addition of an integrated interposer, which eliminates the need for an external interposer. This innovation simplifies setup with fewer connection points and outboard devices, making analysis easier and more reliable than ever. In addition to using the Test Platform with the Exerciser, the user can connect two of their own devices and use the Test Platform as a PCIe 5.0 backplane and as an interposer to capture protocol traffic between the systems.
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iWave Systems Technologies
iWave 3U VPX High-Speed Video/Data Processing Card is a rugged standalone module in the 3U VPX form factor, aimed for the high-speed data, video processing, and display applications is ideal for military, defense, and aerospace applications requiring an optimal balance of performance and power efficiency. iWave 3U VPX High-Speed Video/Data Processing Card is implemented using Xilinx Kintex-7 device architecture and has I/O interfaces including High speed 16 channels of transceiver interfaces capable of operating up to 6 Gbps data rate, Gigabit Ethernet, RS232, RS422, PCIe interface, Built-in health monitoring circuits, HDMI input, and output interfaces
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GT9000P-USB3 -
Guide Technology, Inc.
A 2 channel Portable “CTIA” and/or “TIC” Test Platform controlled by USB3
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GT9000 -
Guide Technology, Inc.
GT9000 is a scalable 2 to 10 channelsBench-Top CTIA and/or TIC Test Platformwith 10” touch-screen-display (iPhone quality), integrated GUI with Touch, Ethernet, WiFi and/or wireless keyboard & mouse.
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GT9000R -
Guide Technology, Inc.
GT9000R is a scalable 2 to 24 channels 19”Rack-Mount CTIA and/or TIC Test Platformwith integrated GUI, Ethernet, Wi-Fi and/orwireless keyboard & mouse.
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M9033A -
Keysight Technologies
The M9033A PXIe System Synchronization Module is a dual-slot, 5-port module that provides multi-module and multi-chassis synchronization and triggering for Keysight's modular instruments.
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M9032A -
Keysight Technologies
The M9032A has a Soft Front Panel (SFP) that provides a graphical user interface to the system sync module. It allows the user to set up the most commonly used functionalities of the module. The SFP also gives you the ability to check the module's connection status, configure the reference clock and IO settings, and perform firmware udpates.
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Maccor Series 4000, Model 4200, and Model 4300 Automated Test Systems -
Maccor, Inc.
The Maccor Series 4000, Model 4200, and Model 4300 Automated Test Systems can be configured with an M option. This option adds a Multiplexer to the test system which allows the channels to be connected to a Princeton Applied Research PARSTAT 4000 or Solartron Analytical 1260/87 impedance analyzer. With the impedance analyzer connected to the test system via the multiplexer the user can then program impedance tests in the Maccor test procedure which when reached will cause the test system to automatically disconnect the Maccor test channel from the device and connect the impedance analyzer to the device. When the impedance test is completed the test system will then automatically disconnect the impedance analyzer from the device and connect the Maccor test channel back to the device and continue with the programmed test procedure. For the Series 4000 Automated Test System, multiple multiplexers and impedance analyzers may be connected to a single test system. Contact the Maccor sales department with any questions concerning this option and for information concerning other supported models of impedance analyzers.
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ActivATE™ -
Advantest Corp.
Easily create and run robust test programs in semiconductor automated test systems with ActivATE™ test management software. Designed by test engineers for test engineers, ActivATE™ tames automated test complexities with elegant simplicity.